Are you seeking to thoroughly analyze your sample? Our cutting-edge technology offers the ability to magnify images up to 100k times, determine elemental composition, and measure roughness. Look no further! At i-Nano Research Facility, we are equipped to assist you with these precise characterizations.
Phenom Pro X and Phenom XL are scanning electron microscopes (SEMs) with added Energy Dispersive X-ray (EDX) functionality. They are advanced SEMs designed for high-resolution imaging and elemental analysis. They are widely used in various scientific and industrial applications, including materials science, nanotechnology, and quality control. The EDX functionality allows users to perform elemental analysis by detecting characteristic X-rays emitted from the sample when it is bombarded with electrons. This enables researchers to identify and quantify the elements present in the sample, providing valuable information about its composition and structure.
Here are sample SEM images
Here are sample Elemental Analysis
Sample Scientific Report (Task of the researcher)
Download sample SEM and EDX files https://drive.google.com/drive/folders/1Z2xSd-d935kg6bFXfIpvtg8A_0EWd5Td?usp=sharing